Sam Subramanian, Khiem Ly, Jacob Levenson, Tony Chrastecky
{"title":"TEM Techniques for Semiconductor Failure Analysis","authors":"Sam Subramanian, Khiem Ly, Jacob Levenson, Tony Chrastecky","doi":"10.31399/asm.cp.istfa2023tpk1","DOIUrl":null,"url":null,"abstract":"Abstract Presentation slides for the ISTFA 2023 Tutorial session “TEM Techniques for Semiconductor Failure Analysis.”","PeriodicalId":20443,"journal":{"name":"Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2023-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.31399/asm.cp.istfa2023tpk1","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Abstract Presentation slides for the ISTFA 2023 Tutorial session “TEM Techniques for Semiconductor Failure Analysis.”
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
