Greg Johnson, Andreas Rummel, Chengliang Huang, Domenico Mello, Frank Hitzel, Heiko Stegmann, Hirotoshi Terada, John Byrnes, Shubhodeep Goswami
{"title":"Power Semiconductor Failure Analysis Tutorial","authors":"Greg Johnson, Andreas Rummel, Chengliang Huang, Domenico Mello, Frank Hitzel, Heiko Stegmann, Hirotoshi Terada, John Byrnes, Shubhodeep Goswami","doi":"10.31399/asm.cp.istfa2023tpt1","DOIUrl":null,"url":null,"abstract":"Abstract Presentation slides for the ISTFA 2023 Tutorial session “Power Semiconductor Failure Analysis Tutorial.”","PeriodicalId":20443,"journal":{"name":"Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2023-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.31399/asm.cp.istfa2023tpt1","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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