Improvement of β-SiC Synthesis Technology on Silicon Substrate

Yana Suchikova, Sergii Kovachov, Ihor Bohdanov, Artem L. Kozlovskiy, Maxim V. Zdorovets, Anatoli I. Popov
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Abstract

This article presents an enhanced method for synthesizing β-SiC on a silicon substrate, utilizing porous silicon as a buffer layer, followed by thermal carbide formation. This approach ensured strong adhesion of the SiC film to the substrate, facilitating the creation of a hybrid hetero-structure of SiC/por-Si/mono-Si. The surface morphology of the SiC film revealed islands measuring 2–6 μm in diameter, with detected micropores that were 70–80 nm in size. An XRD analysis confirmed the presence of spectra from crystalline silicon and crystalline silicon carbide in cubic symmetry. The observed shift in spectra to the low-frequency zone indicated the formation of nanostructures, correlating with our SEM analysis results. These research outcomes present prospects for the further utilization and optimization of β-SiC synthesis technology for electronic device development.
硅衬底上β-SiC合成技术的改进
本文提出了一种在硅衬底上合成β-SiC的改进方法,利用多孔硅作为缓冲层,然后形成热碳化物。这种方法确保了SiC薄膜与衬底的强附着力,促进了SiC/ poro - si /mono-Si杂化异质结构的形成。SiC薄膜表面形貌显示出直径为2 ~ 6 μm的岛状结构,并检测到70 ~ 80 nm大小的微孔。XRD分析证实了晶体硅和晶体碳化硅的立方对称光谱的存在。观察到的光谱向低频区移动表明纳米结构的形成,与我们的SEM分析结果相一致。这些研究成果为β-SiC合成技术在电子器件开发中的进一步应用和优化提供了前景。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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