{"title":"Determination of electrical and thermal parameters of vertical-cavity surface-emitting lasers","authors":"","doi":"10.24425/mms.2023.146417","DOIUrl":null,"url":null,"abstract":"Experimental methods are presented for determining the thermal resistance of vertical-cavity surface-emitting lasers (VCSELs) and the lateral electrical conductivity of their p-type semiconductor layers. A VCSEL structure was manufactured from III-As compounds on a gallium arsenide substrate. Conductivity was determined using transmission line measurement (TLM). Electrical and thermal parameters were determined for various ambient temperatures. The results could be used for computer analysis of VCSELs.","PeriodicalId":18394,"journal":{"name":"Metrology and Measurement Systems","volume":"18 9","pages":"0"},"PeriodicalIF":1.0000,"publicationDate":"2023-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Metrology and Measurement Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.24425/mms.2023.146417","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
引用次数: 0
Abstract
Experimental methods are presented for determining the thermal resistance of vertical-cavity surface-emitting lasers (VCSELs) and the lateral electrical conductivity of their p-type semiconductor layers. A VCSEL structure was manufactured from III-As compounds on a gallium arsenide substrate. Conductivity was determined using transmission line measurement (TLM). Electrical and thermal parameters were determined for various ambient temperatures. The results could be used for computer analysis of VCSELs.
期刊介绍:
Contributions are invited on all aspects of the research, development and applications of the measurement science and technology.
The list of topics covered includes: theory and general principles of measurement; measurement of physical, chemical and biological quantities; medical measurements; sensors and transducers; measurement data acquisition; measurement signal transmission; processing and data analysis; measurement systems and embedded systems; design, manufacture and evaluation of instruments.
The average publication cycle is 6 months.