J. Yang, Y. Li, J. Deng, Z. Zhang, J. Zhou, X. Zhang
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引用次数: 0
Abstract
Background
The accuracy and reliability of digital image correlation (DIC) technologies are not only dependent on correlation algorithms but also strongly affected by the quality of the speckle patterns, especially under extremely low temperatures and large deformation conditions.
Objective
To overcome the challenge that the speckle patterns become more brittle and harder in the extremely low temperature experiments near liquid helium, and speckles cracking and shedding during the large deformation processes.
Methods
Novel speckle patterns and fabrication technologies have been developed specifically tailored to extremely low temperatures and large deformation conditions.
Results
A novel spinning-coated speckle fabrication method based on PDMS silicone and TiO2 spherical particles was proposed, which can enable extremely low temperatures of DIC measurements above 20% strain. Using the 316LN stainless steel as a sample, the performances of several common speckles have been compared, and the strain localization and propagation had also been clarified.
Conclusions
The novel DIC full-field measurement method was validated with 316LN stainless steel, which confirmed that the speckles have excellent stability in the process of large deformation at extremely low temperatures. In addition, the formation and propagation processes of the slip bands for 316LN stainless steel have been revealed.
期刊介绍:
Experimental Mechanics is the official journal of the Society for Experimental Mechanics that publishes papers in all areas of experimentation including its theoretical and computational analysis. The journal covers research in design and implementation of novel or improved experiments to characterize materials, structures and systems. Articles extending the frontiers of experimental mechanics at large and small scales are particularly welcome.
Coverage extends from research in solid and fluids mechanics to fields at the intersection of disciplines including physics, chemistry and biology. Development of new devices and technologies for metrology applications in a wide range of industrial sectors (e.g., manufacturing, high-performance materials, aerospace, information technology, medicine, energy and environmental technologies) is also covered.