An efficient parallel transparent diagnostic BIST

Proceedings of the Ninth Asian Test Symposium Pub Date : 2000-12-04 DOI:10.1109/ATS.2000.893640

D. Huang, W. Jone

引用次数: 2

Abstract

In this paper, we propose a new transparent Built-in Self-Diagnosis (BISD) method to diagnose multiple embedded memory arrays with various sizes in parallel. A new transparent diagnostic interface has been proposed to perform testing in normal mode. By tolerating redundant read/write/shift operations, we develop a new march algorithm called TDiagRSMarch to achieve the goals of low hardware overhead, lower test time, and high test coverage. Experimental results demonstrate that the diagnostic efficiency of TDiagRSMarch is independent of memory topology, defect-type distribution, and degree of parallelism.

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一种高效的并行透明诊断BIST

本文提出了一种新的透明内置自诊断(BISD)方法，用于并行诊断多个不同大小的嵌入式存储阵列。提出了一种新的透明诊断接口，可以在正常模式下进行测试。通过容忍冗余的读/写/移位操作，我们开发了一种名为TDiagRSMarch的新行军算法，以实现低硬件开销、低测试时间和高测试覆盖率的目标。实验结果表明，TDiagRSMarch的诊断效率与内存拓扑结构、缺陷类型分布和并行度无关。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Proceedings of the Ninth Asian Test Symposium

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