Band structure engineered Germanium-Tin (GeSn) p-channel tunnel transistors

R. Pandey, R. Ghosh, S. Datta
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引用次数: 2

Abstract

In this work, we perform a detailed materials and device design evaluation for p-channel homo-junction and hetero-junction Tunnel FETs in Ge and GeSn material system. We start with atomistic level materials simulation using first principles density functional theory (DFT) and extend it to device level TCAD simulation. We show clearly the impact of tuning Sn composition to engineer the band structure and control the relative contribution of the direct and phonon assisted indirect band-to-band tunneling to design and demonstrate p-channel Tunnel FET in the Group IV system that are competitive with their III-V compound semiconductor counterparts.
带结构工程锗锡(GeSn) p沟道隧道晶体管
在这项工作中,我们在Ge和GeSn材料体系中对p沟道同质结和异质结隧道场效应管进行了详细的材料和器件设计评估。我们从原子级材料模拟开始,使用第一性原理密度泛函理论(DFT),并将其扩展到器件级TCAD模拟。我们清楚地展示了调整Sn组成对设计带结构和控制直接和声子辅助间接带到带隧道的相对贡献的影响,从而设计和展示了在IV组系统中与III-V化合物半导体同行竞争的p沟道隧道场效应管。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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