Enhanced silicon-on-insulator platform enabling new structures and applications

A. Haapalinna, T. Aalto
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引用次数: 1

Abstract

Performance expectations for microelectromechanical systems (MEMS), the central building blocks of smart systems, are increasing rapidly. The rapidly growing IoT industry sets completely new demands, while existing industries such as automotive sensing is rapidly moving to a completely new requirements levels with autonomous driving (ADAS systems). Advanced MEMS devices are increasingly based on single crystal silicon, enabling uncompromised, high performance mechanical operation of the device. Efficient, repeatable mass production is achieved by utilizing state-of-the-art MEMS processing technology based on thick-film bonded Silicon-On-Insulator wafers (BSOI) starting material. Continuous device shrinking and requirements for unprecedented performance for high end sensors are driving requirements for SOI wafer specifications to a level at which traditional planarization technologies like chemical mechanical polishing (CMP) are stretched to their limits. At the same time, emerging applications are posing new challenges, requiring substrates with specifications that simply cannot be met with the traditional production technology.
增强型绝缘体上硅平台,支持新结构和应用
作为智能系统的核心组成部分,对微机电系统(MEMS)的性能期望正在迅速提高。快速增长的物联网行业提出了全新的需求,而汽车传感等现有行业正迅速向自动驾驶(ADAS系统)的全新要求水平迈进。先进的MEMS器件越来越多地基于单晶硅,使器件的机械操作不受影响,高性能。利用基于厚膜结合绝缘体上硅晶圆(BSOI)起始材料的最先进的MEMS加工技术,实现了高效,可重复的批量生产。不断缩小的器件尺寸和对高端传感器空前性能的要求,推动了对SOI晶圆规格的要求,使化学机械抛光(CMP)等传统平面化技术达到了极限。与此同时,新兴应用正在提出新的挑战,要求基材的规格根本无法满足传统生产技术。
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