ESD protection techniques for semiconductor devices

J. Vinson, J. Liou
{"title":"ESD protection techniques for semiconductor devices","authors":"J. Vinson, J. Liou","doi":"10.1109/ICMEL.2000.840579","DOIUrl":null,"url":null,"abstract":"Electrostatic discharges (ESD) are everywhere-in our homes, businesses and even at the manufacturers of the electronics we buy. The discharges cause failure of these electronic components. Presented here is a two pronged approach for ESD protection: reduce the likelihood of having an ESD event and improving the robustness of the devices. The first approach focuses on reducing the charge developed and controlling the redistribution of any charges that are developed. The second approach looks at ways to improve both the processes used to build electronics as well as the devices themselves.","PeriodicalId":215956,"journal":{"name":"2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMEL.2000.840579","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

Abstract

Electrostatic discharges (ESD) are everywhere-in our homes, businesses and even at the manufacturers of the electronics we buy. The discharges cause failure of these electronic components. Presented here is a two pronged approach for ESD protection: reduce the likelihood of having an ESD event and improving the robustness of the devices. The first approach focuses on reducing the charge developed and controlling the redistribution of any charges that are developed. The second approach looks at ways to improve both the processes used to build electronics as well as the devices themselves.
半导体器件的ESD保护技术
静电放电(ESD)无处不在——在我们的家中、企业中,甚至在我们购买的电子产品的制造商中。放电导致这些电子元件失效。本文介绍了ESD保护的两种方法:降低发生ESD事件的可能性和提高器件的稳健性。第一种方法侧重于减少已产生的电荷并控制已产生的电荷的再分配。第二种方法着眼于改进制造电子产品的过程和设备本身。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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