Control of Sub-Nanosecond Precessional Magnetic Switching in STT-MRAM Cells for SRAM Applications

B. Lacoste, M. Marins de Castro, R. Sousa, I. Prejbeanu, L. Buda-Prejbeanu, S. Auffret, U. Ebels, B. Rodmacq, B. Dieny
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引用次数: 3

Abstract

STT-MRAM are foreseen as the best contender for DRAM replacement. STT-MRAM could also be used for SRAM applications if switching time below 1ns could be realized in a reliable way. In this study, we demonstrate that sub-ns switching with final state determined by the current polarity through the stack can be achieved in STT-MRAM cells comprising two spin-polarizing layers having orthogonal magnetic anisotropies [1],[2]. We carried out a thorough experimental and modeling study of these ultrafast STT-MRAM. We demonstrated that a quite reliable switching can be achieved by increasing the cell aspect ratio (AR) or advantageously by applying an in-plane static transverse field on the cell. Switching in 200ps could be demonstrated with write energy less than 100fJ.
用于SRAM的STT-MRAM单元的亚纳秒进动磁开关控制
STT-MRAM被认为是DRAM替代品的最佳竞争者。如果可以可靠地实现低于1ns的开关时间,STT-MRAM也可以用于SRAM应用。在本研究中,我们证明了在STT-MRAM电池中,由两个具有正交磁各向异性的自旋极化层组成的STT-MRAM电池可以实现亚ns开关,其最终状态由电流极性决定[1],[2]。我们对这些超快STT-MRAM进行了全面的实验和建模研究。我们证明了一个相当可靠的开关可以通过增加单元宽高比(AR)或有利地通过在单元上施加一个面内静态横向场来实现。在写入能量小于100fJ的情况下,可以实现200ps的开关。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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