Outlier Screening for Advanced Automotive Applications

Abstract

Rapid adoption of semiconductor devices in automotive industry, especially for self-driving cars, has demanded stringent reliability and quality requirements on them. How to apply various test strategies and innovative methods to detect and filter out outlier devices that could impose reliability issues has become a challenge that every fab and fabless company has to face with urgency and open mind. In this paper, the authors have reported various algorithms and techniques to dynamically identify outliers among devices for automotive applications. These methodologies have provided significant competitive advantages in manufacturing process monitoring, product quality improvement, and product qualifications.