Test platform for fault tolerant systems design properties verification

M. Straka, Lukas Miculka, Jan Kastil, Z. Kotásek
{"title":"Test platform for fault tolerant systems design properties verification","authors":"M. Straka, Lukas Miculka, Jan Kastil, Z. Kotásek","doi":"10.1109/DDECS.2012.6219084","DOIUrl":null,"url":null,"abstract":"In this paper, a methodology for fault tolerant systems design properties verification is presented together with recovery technique for a fault tolerant system after soft errors occurrence in a SRAM-based FPGA. First, the principles of test platform based on an external SEU injector are presented; all components of test platform and their role during SEU simulation are described. Then, a recovery technique based on the generic partial dynamic reconfiguration controller implemented inside an FPGA is presented. The controller is used for the identification of a faulty module in the fault tolerant system, reconfiguration of this module through ICAP interface and synchronization of the module after reconfiguration process with other modules in the system. The controller can be used for the identification of permanent faults in the FPGA structure as well. The first experiments with a test platform and reconfiguration controller are discussed in this paper.","PeriodicalId":131623,"journal":{"name":"2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","volume":"135 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-04-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DDECS.2012.6219084","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

Abstract

In this paper, a methodology for fault tolerant systems design properties verification is presented together with recovery technique for a fault tolerant system after soft errors occurrence in a SRAM-based FPGA. First, the principles of test platform based on an external SEU injector are presented; all components of test platform and their role during SEU simulation are described. Then, a recovery technique based on the generic partial dynamic reconfiguration controller implemented inside an FPGA is presented. The controller is used for the identification of a faulty module in the fault tolerant system, reconfiguration of this module through ICAP interface and synchronization of the module after reconfiguration process with other modules in the system. The controller can be used for the identification of permanent faults in the FPGA structure as well. The first experiments with a test platform and reconfiguration controller are discussed in this paper.
测试平台的容错系统设计特性验证
本文提出了一种基于sram的FPGA的容错系统设计特性验证方法,以及容错系统发生软错误后的恢复技术。首先,介绍了基于外置SEU喷油器的测试平台的原理;介绍了测试平台的各组成部分及其在模拟过程中的作用。然后,提出了一种基于FPGA实现的通用局部动态重构控制器的恢复技术。控制器用于识别容错系统中的故障模块,通过ICAP接口对该模块进行重新配置,并在重新配置过程中与系统中的其他模块同步。该控制器还可用于FPGA结构中永久性故障的识别。本文讨论了用测试平台和重构控制器进行的第一次实验。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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