Comparative Stability Analysis of Pristine and AsF5 Intercalation Doped Top Contact Graphene Nano Ribbon Interconnects

Subhajit Das, S. Bhattacharya, Debaprasad Das, H. Rahaman
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引用次数: 1

Abstract

In this work, a comparative stability analysis of copper (Cu), pristine and AsF5-intercalated top contact (TC) multilayer graphene nanoribbon (MLGNR) interconnect is presented. In this work, Bode stability formalism of AsF5 - intercalated TC-MLGNR interconnect using ABCD transmission parameter based multi-conductor transmission line model, has been presented for the first time. The variation in stability has been studied for conventional copper, pristine and AsF5 intercalated interconnect for different interconnect lengths (10$\mu$m and 100$\mu$m) and different level of edge roughness. It is shown that, AsF5-interclation doped TC-MLGNR interconnects offer better stability, for similar dimensions, than its pristine counterpart as well as conventional copper wires at local, intermediate and global interconnect for high frequency applications.
原始和AsF5掺杂顶部接触石墨烯纳米带互连的稳定性比较分析
在这项工作中,提出了铜(Cu),原始和asf5插层顶部接触(TC)多层石墨烯纳米带(MLGNR)互连的比较稳定性分析。本文首次提出了基于ABCD传输参数的多导体传输线模型的AsF5插层TC-MLGNR互连的波德稳定性形式。研究了不同互连长度(10$\mu$m和100$\mu$m)和不同边缘粗糙度水平下传统铜互连、原始互连和AsF5互连的稳定性变化。研究表明,在相似的尺寸下,asf5掺杂TC-MLGNR互连在高频应用的局部、中间和全局互连中,比其原始对应物以及传统铜线具有更好的稳定性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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