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Optical Constants of Polycrystalline Cd1xZnxTe Thin Films by Spectroscopic Ellipsometry

Advanced Materials for Optics and Electronics Pub Date : 1997-05-01 DOI:10.1002/(SICI)1099-0712(199705)7:3<109::AID-AMO296>3.3.CO;2-W
K. Rao, O. Hussain, B. Naidu, P. Reddy
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引用次数: 2
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多晶Cd1xZnxTe薄膜的椭偏光谱光学常数
本文章由计算机程序翻译，如有差异，请以英文原文为准。
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Advanced Materials for Optics and Electronics
Advanced Materials for Optics and Electronics
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