Defect-Free Dicing for Higher Device Reliability

C. Johnston, F. Piallat
{"title":"Defect-Free Dicing for Higher Device Reliability","authors":"C. Johnston, F. Piallat","doi":"10.1109/ESTC.2018.8546448","DOIUrl":null,"url":null,"abstract":"As new technology application devices are relied upon for our safety, security, ease of life and wellbeing, the reliability of such devices is imperative. Devices with unfailing performance are critical to create trustworthy and smarter solutions. The adoption of these devices to “out-of-the-box” applications brings new packaging challenges as devices must withstand and perform in a wide range of physical and environmental conditions. By a virtuous circle, dependence on these solutions will grow as they are increasingly trusted upon for our health, safety, security and to improve our way of life.","PeriodicalId":198238,"journal":{"name":"2018 7th Electronic System-Integration Technology Conference (ESTC)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 7th Electronic System-Integration Technology Conference (ESTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESTC.2018.8546448","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

As new technology application devices are relied upon for our safety, security, ease of life and wellbeing, the reliability of such devices is imperative. Devices with unfailing performance are critical to create trustworthy and smarter solutions. The adoption of these devices to “out-of-the-box” applications brings new packaging challenges as devices must withstand and perform in a wide range of physical and environmental conditions. By a virtuous circle, dependence on these solutions will grow as they are increasingly trusted upon for our health, safety, security and to improve our way of life.
无缺陷切割,提高设备可靠性
随着我们的安全、保障、生活便利和福祉依赖于新技术应用设备,这些设备的可靠性至关重要。具有持久性能的设备对于创建值得信赖和更智能的解决方案至关重要。采用这些设备的“开箱即用”应用带来了新的封装挑战,因为设备必须承受并在广泛的物理和环境条件下运行。通过一个良性循环,对这些解决方案的依赖将会增加,因为它们在我们的健康、安全、保障和改善我们的生活方式方面越来越受信任。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信