Process Variability Challenges for Radiation Mitigation Techniques on 16nm

Abstract

This paper investigates the impact of process variability on traditional radiation and noise mitigation techniques for deep nanometer bulk CMOS technologies. Schmitt Trigger, Strengthening, Pseudo-Strengthening, and Rad-Hard techniques are explored observing the sensitivity to process variability. Results show that these techniques operating under process variability can introduce substantial degradation on timing and power. This study presents the benefits, and the drawbacks brought from the applied methods.