A simple & cost-effective novel methodology for predicting SSN system performance for different PCB trace lengths

C. Ang, Wei Wei Lo, M. Wong
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引用次数: 1

Abstract

High data rates, high clock speeds, and low power consumption are synonymous with advanced electronic devices. Consequently, simultaneous switching noise (SSN) is emerging as a critical side-effect of toggling signals within an electronic device because SSN affects signal integrity. Even minute changes in signal voltage in the order of a few millivolts can adversely affect the functioning of a circuit. A PCB typically forms the communication backbone between electronic components including field programmable gate array (FPGA) devices. Signal quality and SSN effects vary with PCB trace lengths. Traditionally, complex board models are used to simulate the SSN characteristics of electronic devices for different PCBs, which can be time consuming and expensive. This paper presents a cost-effective novel methodology for de-embedding the PCB trace effect to accurately characterize an FPGA device's intrinsic SSN characteristics. The methodology uses simple and fast measurement and simulation techniques to de-embed the PCB trace effect for different PCB trace lengths. The predicted SSN data for different PCB trace lengths and intrinsic SSN data obtained using this methodology will be useful to FPGA system designers.
预测不同PCB走线长度的SSN系统性能的一种简单且经济有效的新方法
高数据速率、高时钟速度和低功耗是先进电子设备的代名词。因此,同时开关噪声(SSN)正在成为电子设备中切换信号的一个关键副作用,因为SSN影响信号的完整性。信号电压即使只有几毫伏的微小变化也会对电路的功能产生不利影响。PCB通常构成包括现场可编程门阵列(FPGA)设备在内的电子元件之间的通信骨干。信号质量和SSN影响随PCB走线长度而变化。传统上,使用复杂的电路板模型来模拟不同pcb的电子器件的SSN特性,这既耗时又昂贵。本文提出了一种经济有效的新方法,用于去除PCB走线效应,以准确表征FPGA器件的固有SSN特性。该方法采用简单快速的测量和仿真技术来去除不同PCB走线长度的PCB走线效应。使用该方法获得的不同PCB走线长度的预测SSN数据和固有SSN数据将对FPGA系统设计人员有用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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