Measurement system for test memory cells based on keysight B1500A semiconductor device analyzer running LabVIEW software

2017 International Siberian Conference on Control and Communications (SIBCON) Pub Date : 2017-06-01 DOI:10.1109/SIBCON.2017.7998542

I. Shvetsov-Shilovskiy, A. Boruzdina, A. Ulanova, A. A. Orlov, K. Amburkin, A. Nikiforov

引用次数: 9

Abstract

The Keysight B1500A semiconductor device analyzer based measurement system for test memory cells research is introduced. The connection of a device under test is described as well as the full list of the utilized equipment. The features of the Keysight equipment remote control by means of Keysight VISA are demonstrated; code examples in LabVIEW environment are also presented.

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测试存储单元的测量系统基于keysight B1500A半导体器件分析仪，运行LabVIEW软件

介绍了基于Keysight B1500A半导体器件分析仪的测试存储单元测量系统的研究。被测设备的连接以及所使用设备的完整列表被描述。演示了Keysight VISA远程控制系统的特点;并给出了LabVIEW环境下的代码示例。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2017 International Siberian Conference on Control and Communications (SIBCON)

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