{"title":"Speeding-up I/sub DDQ/ measurements","authors":"C. Thibeault","doi":"10.1109/VTS.2002.1011157","DOIUrl":null,"url":null,"abstract":"The purpose of this paper is to introduce a new I/sub DDQ/ measurement technique based on active successive approximations, named ASA-I/sub DDQ/. This technique has unique features allowing to speed-up I/sub DDQ/ measurement. Experimental results suggests that a significant speed-up factor can be obtained over the QuiC-Mon technique.","PeriodicalId":237007,"journal":{"name":"Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-04-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTS.2002.1011157","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The purpose of this paper is to introduce a new I/sub DDQ/ measurement technique based on active successive approximations, named ASA-I/sub DDQ/. This technique has unique features allowing to speed-up I/sub DDQ/ measurement. Experimental results suggests that a significant speed-up factor can be obtained over the QuiC-Mon technique.