SEE Testing Results for RF and Microwave ICs

2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI:10.1109/REDW.2014.7004589

G. Chukov, V. Elesin, G. Nazarova, A. Nikiforov, D. Boychenko, V. Telets, A. Kuznetsov, K. Amburkin

引用次数: 10

Abstract

A short overview of single event effects for a variety of RF and microwave ICs is presented. New results obtained at the SPELS test center have been used along with published data.

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SEE射频和微波集成电路测试结果

简要概述了各种射频和微波集成电路的单事件效应。在SPELS测试中心获得的新结果与已发表的数据一起使用。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2014 IEEE Radiation Effects Data Workshop (REDW)

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