A new class of fault models and test algorithms for dual-port dynamic RAM testing

Records of the 1993 IEEE International Workshop on Memory Testing Pub Date : 1993-08-09 DOI:10.1109/MT.1993.263147

V. Castro Alves, O. Kebichi, Á. Ferreira

引用次数: 2

Abstract

In this paper, the authors present a new class of fault models called duplex pattern sensitive faults that represents more accurately the actual faults that can occur in dual-port DRAMs. Then, they propose an efficient linear test algorithm that allows 100% fault coverage for the considered fault model.<>

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一种新的双端口动态RAM故障模型和测试算法

在本文中，作者提出了一类新的故障模型，称为双工模式敏感故障，它更准确地代表了双端口dram中可能发生的实际故障。然后，他们提出了一种有效的线性测试算法，该算法允许所考虑的故障模型100%的故障覆盖率。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Records of the 1993 IEEE International Workshop on Memory Testing

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