{"title":"Evaluation of LDMOS transistors for 10 Gbps switched mode applications and X-band power amplifier","authors":"C. Wipf, R. Sorge, Jens Schmidt","doi":"10.1109/SIRF.2016.7445467","DOIUrl":null,"url":null,"abstract":"In this article we report on the capability of integrated LDMOS transistors for power amplifiers in 10 gigabit per second (Gbps) communication systems, smart power systems and X-band power amplifiers. The switched mode properties of the amplifier were evaluated using a 10.3125 Gbps pseudo random bit error sequence (PRBS) signal. A test mask according to the IEEE P802.3aq 10GBASE-LRM Ethernet standard was applied to evaluate the recorded eye diagram. No single hit was detected in the forbidden test mask regions after measuring 6 million data points. Load-pull measurements at 11 GHz show an operational gain of 16 dB, a maximum power added efficiency (PAE) of 30 % and a maximum drain efficiency (EFF) of 38 %. RF small signal scattering parameters of the LDMOS transistor were measured up to 67 GHz. A cutoff frequency of 27 GHz and a maximum oscillation frequency of 61 GHz were extracted. The investigated n-LDMOS transistor is modularly integrated into a 0.25 μm SiGe:C BiCMOS Technology.","PeriodicalId":138697,"journal":{"name":"2016 IEEE 16th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 16th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SIRF.2016.7445467","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
In this article we report on the capability of integrated LDMOS transistors for power amplifiers in 10 gigabit per second (Gbps) communication systems, smart power systems and X-band power amplifiers. The switched mode properties of the amplifier were evaluated using a 10.3125 Gbps pseudo random bit error sequence (PRBS) signal. A test mask according to the IEEE P802.3aq 10GBASE-LRM Ethernet standard was applied to evaluate the recorded eye diagram. No single hit was detected in the forbidden test mask regions after measuring 6 million data points. Load-pull measurements at 11 GHz show an operational gain of 16 dB, a maximum power added efficiency (PAE) of 30 % and a maximum drain efficiency (EFF) of 38 %. RF small signal scattering parameters of the LDMOS transistor were measured up to 67 GHz. A cutoff frequency of 27 GHz and a maximum oscillation frequency of 61 GHz were extracted. The investigated n-LDMOS transistor is modularly integrated into a 0.25 μm SiGe:C BiCMOS Technology.