Nonvolatile memories: Present and future challenges

E. Vatajelu, H. Aziza, C. Zambelli
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引用次数: 32

Abstract

Due to the rapid development of hand-held electronic devices, the need for high density, low power, high performance SoCs has pushed the well-established embedded memory technologies to their limits. To overcome the existing memory issues, emerging memory technologies are being developed and implemented. The focus is placed on non-volatile technologies, which should meet the high demands of tomorrow applications. The nonvolatile memory technologies being intensively researched today are the Flash memories and the emerging resistive and magnetic type random access memories. This paper presents an overview of device level operation of these nonvolatile memories, with special emphasis on the fabrication-and aging-induced reliability issues.
非易失性记忆:现在和未来的挑战
由于手持式电子设备的快速发展,对高密度、低功耗、高性能soc的需求已经将成熟的嵌入式存储技术推向了极限。为了克服现有的内存问题,新兴的内存技术正在被开发和实现。重点放在非易失性技术上,这些技术应该满足未来应用的高要求。目前正在深入研究的非易失性存储技术是闪存和新兴的电阻式和磁性随机存取存储器。本文概述了这些非易失性存储器的器件级操作,特别强调了制造和老化引起的可靠性问题。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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