A 30Gb/s/link 2.2Tb/s/mm2 inductively-coupled injection-locking CDR

Yasuhiro Take, N. Miura, T. Kuroda
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引用次数: 4

Abstract

This paper presents a 30Gb/s/link 2.2Tb/s/mm2 inductive-coupling link for a high-speed DRAM interface. The data rate per layout area is the highest among DRAM interfaces reported up to now [1–11]. The proposed interface employs a high-speed injection-locking CDR technique that utilizes the derivative property of inductive coupling. Compared to conventional injection-locking CDR based on an XOR edge detector, our technique doubles the operation speed and increases the data rate to 30Gb/s/link. As a result, the data rate per layout area is increased to 2.2Tb/s/mm2, which is 2X that of the state-of-the-art inductive-coupling link [1], and 22X that of the state-of-the-art wired link [3].
30Gb/s/链路2.2Tb/s/mm2电感耦合注入锁定CDR
本文提出了一种用于高速DRAM接口的30Gb/s/ 2.2Tb/s/mm2电感耦合链路。每个布局区域的数据速率是目前报道的DRAM接口中最高的[1-11]。该接口采用高速注入锁定CDR技术,利用了电感耦合的导数特性。与基于XOR边缘检测器的传统注入锁定CDR相比,我们的技术将操作速度提高了一倍,并将数据速率提高到30Gb/s/link。因此,每个布局区域的数据速率提高到2.2Tb/s/mm2,是最先进的电感耦合链路[1]的2倍,是最先进的有线链路[3]的22倍。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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