Capacitive out of plane large stroke MEMS structure

C. Glacer, R. Laur, A. Dehé, D. Tumpold
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引用次数: 3

Abstract

This paper introduces a way to increase the airgap of a capacitive MEMS sensor or actuator. Usually, a thicker sacrificial layer composed of silicon dioxide is used to increase the distance between two parallel plates. In our case, both poly-silicon planes are being produced with a small gap filled with silicon dioxide. Corrugation grooves lined with highly tensile silicon nitride cause a stress induced displacement of the stator after the release etch was done. We will present first results, gained from FEM-simulations and fabricated wafers. An insight into the optimization of the deflection profile and the mechanical stability of the buckling electrode is discussed.
电容式面外大行程MEMS结构
本文介绍了一种增大电容式MEMS传感器或执行器气隙的方法。通常,采用由二氧化硅组成的较厚的牺牲层来增加两个平行板之间的距离。在我们的例子中,两种多晶硅平面都是用二氧化硅填充的小间隙生产的。波纹槽内衬高拉伸氮化硅引起定子的应力诱导位移后释放蚀刻完成。我们将展示从fem模拟和制造晶圆中获得的第一个结果。讨论了屈曲电极挠曲轮廓和力学稳定性的优化问题。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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