Detection of micro-Te segregation at the interface of Cu/Cr phases in Cu-30Cr-0.01Te alloy contact material by XPS

Abstract

The composition and bonding energy of Te segregation in Cu-30Cr-0.01Te alloy contact material were investigated by X-ray photoelectron spectroscopy. Photoelectron patterns from the main chemical elements of Cu, Cr and Te on the fresh fracture surface of Cu-30Cr-0.01Te alloy contact material show that Te atoms highly segregated at the interface of Cu/Cr phases, thus the structure and property of the interface between Cu/Cr phases were changed and led to reduce the tensile strength and increase anti-welding property of the contact material.