Device Simulation of the Dyakonov-Shur Plasma Instability for THz Wave Generation

C. Jungemann, M. Noei, Tobias Linn
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Abstract

Dyakonov and Shur suggested electron-plasma instabilities in the channel of HEMTs as new sources for THz waves that could fill the THz gap. Their analytical model was based on the Euler equation and Dirichlet boundary conditions for the electron density at the source side of the channel and for the current density at the drain side. There have been many attempts to solve the equations for realistic devices by numerical simulation, where the boundary conditions between the channel and the highly doped source/drain regions (ohmic contacts) are a result of the device simulations. The only boundary conditions, that can be specified in the device simulations are the ones between the highly doped regions and the terminals. It turned out that these boundary conditions have a strong impact on the plasma resonances in the HEMT and the resonances vanish, if the device is simulated by the more physics-based Boltzmann transport equation in conjunction with thermal bath boundary conditions. The lack of plasma instabilities in these simulations is matched by experiments, in which no clear indications of instabilities could be found.
太赫兹波产生中Dyakonov-Shur等离子体不稳定性的器件模拟
Dyakonov和Shur提出,hemt通道中的电子-等离子体不稳定性可以作为太赫兹波的新来源,填补太赫兹波的空白。他们的解析模型是基于欧拉方程和狄利克雷边界条件来计算通道源侧的电子密度和漏侧的电流密度。通过数值模拟求解实际器件的方程已经有很多尝试,其中通道和高掺杂源/漏区(欧姆接触)之间的边界条件是器件模拟的结果。在器件模拟中,唯一可以指定的边界条件是高掺杂区域和终端之间的边界条件。结果表明,这些边界条件对HEMT中的等离子体共振有很强的影响,如果用更基于物理的玻尔兹曼输运方程结合热浴边界条件来模拟该装置,则共振将消失。在这些模拟中缺乏等离子体不稳定性与实验相匹配,在实验中没有发现明确的不稳定性迹象。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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