Reliability study of low cost alternative Ag bonding wire with various bond pad materials

K. Yoo, Chul Uhm, Taeri Kwon, J. Cho, J. Moon
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引用次数: 57

Abstract

There have been many studies on replacing Au bonding wire with other bonding wire materials, because the cost of Au has dramatically increased by approximately 2~3 times in recent years. When replacing part of the bond pad with a noble metal, Ag bonding wire is of particular interest due to its superior electrical properties, lower cost and similar mechanical properties as compared with Au. Ag bonding wire is thermosonically bonded to 3 kinds of bond pad (Al, Au and Pd) and aged at high temperature (175°C). Then, the bondability and interface reactions are characterized at each bond pad. In the case of Ag-Al bonding, 2 kinds of intermediate phases were observed and the composition ratios of Ag and Al in these phases were 4:1 and 2:1, respectively. After 300 hrs of aging, cracks were formed in these intermediate phases and ball-lift failure occurred. However, in the case of the noble metal bond pad, a solid solution was formed between the Ag wire and bond pad and no voids or cracks were formed. This shows the robust bonding characteristics. The diffusion layer was observed and the diffraction pattern was analyzed by TEM (Transmission Electron microscopy). The Au-Al bond reliability was also characterized by a comparative study. In this study, Ag bonding wire is proposed as an alternative to Au bonding wire for noble metal pads. Also, the thermal reliability is reviewed and the failure mechanisms are verified with various bond pads.
不同焊盘材料的低成本银焊线可靠性研究
近年来,由于金的成本急剧增加了约2~3倍,用其他焊线材料代替金焊线的研究也越来越多。当用贵金属替换部分键合垫时,银键合线由于其优越的电性能、更低的成本和与金相比相似的机械性能而特别受关注。Ag键合线采用热声法与3种键合垫(Al、Au和Pd)结合,并在175℃高温下时效。然后,对每个键垫的键合性和界面反应进行了表征。在Ag-Al键合的情况下,观察到两种中间相,其中Ag和Al的组成比例分别为4:1和2:1。时效300 h后,这些中间相形成裂纹,出现球举失效。然而,在贵金属焊盘的情况下,银丝和焊盘之间形成了固溶体,没有形成空洞或裂纹。这表明了坚固的粘接特性。用透射电镜观察了扩散层,分析了衍射图。对Au-Al键的可靠性也进行了比较研究。本研究提出银键合线作为贵金属焊盘的金键合线替代品。同时,对不同焊盘的热可靠性进行了研究,并对失效机理进行了验证。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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