Advances in flip-chip underfill flow and cure rates and their enhancement of manufacturing processes and component reliability

D. Shi, J. Carbin
{"title":"Advances in flip-chip underfill flow and cure rates and their enhancement of manufacturing processes and component reliability","authors":"D. Shi, J. Carbin","doi":"10.1109/ECTC.1996.550808","DOIUrl":null,"url":null,"abstract":"This paper focuses on significant advances in flip-chip underfill materials via a thorough characterization of the uncured and cured material properties. These characteristics are then translated into what amounts to substantial gains in productivity and reliability. A unique method for determining material flow rates is presented. The data demonstrate the critical relationship between viscosity and flow rate as a function of time and temperature. Material cure rates as a function of time and temperature are also presented using results derived from differential scanning calorimetry or DSC. In addition, the dielectric constant and dissipation factor during the cure process are also measured as an added, more sensitive gauge of the degree of cure. The data from both measurement tools demonstrates what the optimum cure time and temperature parameters are, so as to achieve the optimum glass transition temperature (Tg, generated using DSC). Another critical thermal mechanical property of the underfill material, the linear coefficient of thermal expansion, is characterized with results generated using thermomechanical analysis or TMA. The data is then summarized and translated in terms of its actual impact on manufacturing productivity and component reliability.","PeriodicalId":143519,"journal":{"name":"1996 Proceedings 46th Electronic Components and Technology Conference","volume":"114 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1996 Proceedings 46th Electronic Components and Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1996.550808","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12

Abstract

This paper focuses on significant advances in flip-chip underfill materials via a thorough characterization of the uncured and cured material properties. These characteristics are then translated into what amounts to substantial gains in productivity and reliability. A unique method for determining material flow rates is presented. The data demonstrate the critical relationship between viscosity and flow rate as a function of time and temperature. Material cure rates as a function of time and temperature are also presented using results derived from differential scanning calorimetry or DSC. In addition, the dielectric constant and dissipation factor during the cure process are also measured as an added, more sensitive gauge of the degree of cure. The data from both measurement tools demonstrates what the optimum cure time and temperature parameters are, so as to achieve the optimum glass transition temperature (Tg, generated using DSC). Another critical thermal mechanical property of the underfill material, the linear coefficient of thermal expansion, is characterized with results generated using thermomechanical analysis or TMA. The data is then summarized and translated in terms of its actual impact on manufacturing productivity and component reliability.
倒装芯片下填流量和固化速率的研究进展及其对制造工艺和元件可靠性的提高
本文通过对未固化和固化材料性能的全面表征,重点介绍了倒装芯片下填材料的重大进展。然后将这些特性转化为生产力和可靠性方面的实质性收益。提出了一种确定物料流动速率的独特方法。数据表明粘度和流量之间的临界关系是时间和温度的函数。材料固化率作为时间和温度的函数,也可以用差示扫描量热法(DSC)的结果来表示。此外,还测量了固化过程中的介电常数和耗散系数,作为一种附加的、更灵敏的固化程度指标。两种测量工具的数据显示了最佳固化时间和温度参数,从而实现最佳玻璃化转变温度(Tg,由DSC生成)。下填土材料的另一个关键热力学性能,热膨胀线性系数,是用热力学分析或TMA产生的结果来表征的。然后根据其对制造生产率和组件可靠性的实际影响对数据进行总结和转换。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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