Potential induced degradation (PID): Review

Abstract

Potential induced degradation (PID) is a problem that in recent years has been the focus of research and studies on the performance of the photovoltaic module (PV) under field conditions, in view of the consequences caused by this degradation. Even with extensive material, the understanding of the PID phenomenon is still incomplete, but it must be taken into account that technological and environmental diversity are factors that imply in reversal techniques. This article aims to conduct a critical review in order to provide an overview and broad view of the literature available to promote understanding of the current state of PID research. The role is to present the definitions of the PID mechanism supported by scholars and researchers as well as the influence of temperature, humidity and voltage on the progression of the PID and the detection and reversal methodologies and preventive measures in PV c-Si modules.