An improved analytical model of GaN HEMT in cascode configuration during turn-on transition

Ning Zhang, Zhao Lin, Liang Hong, Yunyu Tang, Hao Ma
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引用次数: 5

Abstract

In this paper, an improved analytical model suitable for a high voltage Gallium Nitride high electron mobility transistor (GaN HEMT) in cascode configuration is presented to analyze operating condition and calculate the energy losses during turn-on transition. Aiming to guarantee the superior precision of the model, all the parasitic inductors and capacitors are taken into consideration during the turn-on transition. The turn-on process is divided into five stages. By means of precise circuit equality and analysis, the frequency domain and time domain expressions of voltage and current in different working stages are illustrated in detail. Moreover, the energy losses could be further calculated accordingly. The accuracy of the proposed model is validated by experimental results whatever current and gate resistor change.
一种改进的级联码态GaN HEMT的导通转换分析模型
本文提出了一种适用于级联码结构的高压氮化镓高电子迁移率晶体管(GaN HEMT)的改进分析模型,用于分析其工作状态和计算导通转换过程中的能量损失。为了保证模型的精度,在导通过渡过程中考虑了所有的寄生电感和寄生电容。启动过程分为五个阶段。通过精确的电路方程和分析,详细说明了电压和电流在不同工作阶段的频域和时域表达式。并据此进一步计算能量损失。实验结果验证了该模型的准确性,无论电流和栅极电阻如何变化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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