Fault Tolerant Design Comparison Study of TMR and 5MR

Muhammad Muhaymin Che Ismail, Ili Shairah Abdul Halim, Siti Lailatul Mohd Hassan, A’Zraa Afhzan Ab. Rahim, N. E. Abdullah
{"title":"Fault Tolerant Design Comparison Study of TMR and 5MR","authors":"Muhammad Muhaymin Che Ismail, Ili Shairah Abdul Halim, Siti Lailatul Mohd Hassan, A’Zraa Afhzan Ab. Rahim, N. E. Abdullah","doi":"10.1109/ISIEA51897.2021.9509996","DOIUrl":null,"url":null,"abstract":"Field Programmable Gate Arrays (FPGAs) is widely used especially in critical application such as military system and aerospace system due to its reconfigurable advantages. FPGA may prone to fault due to many factors such as radiation. Redundancy method is used to overcome this problem and can improve the reliability of a system. In this work, fault tolerant design technique for Triple Modular Redundancy (TMR) and Five Modular Redundancy (5MR) were compared on DE1-SoC FPGA boards. Fault were injected by adding a fault module that made selected module become faulty to the circuit under test (CUT) board which is interfaced with the main FPGA board. The result of fault injection test shows 5MR produce more correct output than TMR even though 5MR use 1.67 times more resources.","PeriodicalId":336442,"journal":{"name":"2021 IEEE Symposium on Industrial Electronics & Applications (ISIEA)","volume":"46 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE Symposium on Industrial Electronics & Applications (ISIEA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISIEA51897.2021.9509996","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

Field Programmable Gate Arrays (FPGAs) is widely used especially in critical application such as military system and aerospace system due to its reconfigurable advantages. FPGA may prone to fault due to many factors such as radiation. Redundancy method is used to overcome this problem and can improve the reliability of a system. In this work, fault tolerant design technique for Triple Modular Redundancy (TMR) and Five Modular Redundancy (5MR) were compared on DE1-SoC FPGA boards. Fault were injected by adding a fault module that made selected module become faulty to the circuit under test (CUT) board which is interfaced with the main FPGA board. The result of fault injection test shows 5MR produce more correct output than TMR even though 5MR use 1.67 times more resources.
TMR与5MR容错设计比较研究
现场可编程门阵列(fpga)由于其可重构的优点,在军事系统和航空航天系统等关键应用中得到了广泛的应用。FPGA受辐射等多种因素的影响,容易发生故障。采用冗余方法克服了这一问题,提高了系统的可靠性。本文在DE1-SoC FPGA板上比较了三模冗余(TMR)和五模冗余(5MR)的容错设计技术。故障注入是通过在与主FPGA板接口的被测电路(CUT)板上添加一个使所选模块发生故障的故障模块。故障注入测试结果表明,5MR比TMR多使用1.67倍的资源,但产生了更多的正确输出。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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