High Speed Characterization of Organic Thin Film Transistors

D. Basu, Liang Wang, L. Dunn, A. Dodabalapur, M. Heeney, I. McCulloch
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However organic circuit applications are hindered by low speeds of operation. This is due to the fact that majority of the carriers are trapped in localized states resulting in low field-effect mobilities. However, existence of fast carriers in the channel of a pentacene transistor has been demonstrated by Dunn et. al. by exciting the transistor with a step voltage[ 1]. Drift mobilities of 0.18 cm2/Vs have been obtained for devices with field effect mobilities of 0.07 cm2/Vs. The impulse voltage method is an extension of the step voltage technique which can be used to measure the drift velocity under varying bias conditions. The schematic of the experiment is shown in figure 1. To study transport using the impulse method, the transistor is switched on and allowed to settle in a conducting state. This is followed by the superposition of a small perturbation, a 5 V impulse with a width (FWHM) of 15 nsec, at the source of the transistor, which is otherwise at 0 V (figure 2). Consequently a packet of charge carrier is injected into the channel. Simulations results shown in figure 3 indicate that the drift component of the injected carrier current exceeds its displacement counterpart. The diffusion component can also be neglected for these small timescales of operations. By restricting the drain bias to low voltages it can be safely assumed that the electric field is uniform inside the channel. The transit time can, therefore, be related to the drift mobility as t = L2/_ VDS. Once the carrier flux arrives at the drain, a bias-t is used to divert the transient current into a 500 Q resistor. The voltage across the resistor is therefore a measure of the current generated by the pulse. The shape of the current pulse for Vg = -90 at varying drain voltages is shown in figure 2. By subtracting the parasitic RC delays in the experimental setup, the true transit-time of current pulse can be extracted. This yields a mobility of 1.5 (+0.45, -0.2) cm2/Vs, which is -10 times higher than the FET mobility. Poly(2,5-bis(3-tetradecylthiophen-2-yl)thieno[3,2-b]thiophenes) (pBTTT) was used for this study because of its high field effect mobilities [2]. Linear region mobility of 0. 12 cm2/Vs was obtained at VGS of -100 V. The experimental and simulated I-V characteristics are displayed in Figure 4. The electric fields (E) used in the transient experiments were 104 V/cm. The average drift velocity (v) of the carriers at these fields was greater than 4x 04 cm/s. These results would indicate the presence of carriers in the channel of a transistor that can respond to input frequencies (f) in the megahertz range. (f= v/271L) One of the major significance of these fast response times is the opportunity to construct circuits that can surpass the performance barrier posed by low FET mobility. The maximum operating frequency for digital circuits is governed by the capacitive delays in forming the channel. However, even with a partially formed channel, switching operations can be performed by the faster carriers capable of responding to the input frequency. Therefore a class of circuits can be constructed that doesn't require the completion of channel formation. An example of such a circuit is a rectifier. A rectifier is an integral component of an RFID tag, which converts the inductively coupled ac input power into dc voltages used to operate the rest of the circuit. Such circuits can be operated at frequencies much higher than that predicted by the steady state mobility. In summary, we have made the first measurements of drift velocity and mobility in a polymer transistor. The drift mobilities are 10 times higher than the field-effect mobilities. These high mobilities have been used to explain high frequency operation of organic transistor circuits. 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Abstract

We have developed an electronic method to characterize the drift velocity and mobility of charge carriers in organic thin film transistors. The measurement is based on the movement of a packet of carriers injected into the channel. Drift mobilities obtained are greater than 1 cm2/Vs. These results can lead to the development of a class of circuits that can be operated in the megahertz range. This technique can also be used to explore trap states and therefore obtain a comprehensive understanding of charge transport in these materials. This experiment is the first of its kind to be performed on an organic transistor. Organic semiconductors are endowed with qualities such as easy processibility and variety of materials. However organic circuit applications are hindered by low speeds of operation. This is due to the fact that majority of the carriers are trapped in localized states resulting in low field-effect mobilities. However, existence of fast carriers in the channel of a pentacene transistor has been demonstrated by Dunn et. al. by exciting the transistor with a step voltage[ 1]. Drift mobilities of 0.18 cm2/Vs have been obtained for devices with field effect mobilities of 0.07 cm2/Vs. The impulse voltage method is an extension of the step voltage technique which can be used to measure the drift velocity under varying bias conditions. The schematic of the experiment is shown in figure 1. To study transport using the impulse method, the transistor is switched on and allowed to settle in a conducting state. This is followed by the superposition of a small perturbation, a 5 V impulse with a width (FWHM) of 15 nsec, at the source of the transistor, which is otherwise at 0 V (figure 2). Consequently a packet of charge carrier is injected into the channel. Simulations results shown in figure 3 indicate that the drift component of the injected carrier current exceeds its displacement counterpart. The diffusion component can also be neglected for these small timescales of operations. By restricting the drain bias to low voltages it can be safely assumed that the electric field is uniform inside the channel. The transit time can, therefore, be related to the drift mobility as t = L2/_ VDS. Once the carrier flux arrives at the drain, a bias-t is used to divert the transient current into a 500 Q resistor. The voltage across the resistor is therefore a measure of the current generated by the pulse. The shape of the current pulse for Vg = -90 at varying drain voltages is shown in figure 2. By subtracting the parasitic RC delays in the experimental setup, the true transit-time of current pulse can be extracted. This yields a mobility of 1.5 (+0.45, -0.2) cm2/Vs, which is -10 times higher than the FET mobility. Poly(2,5-bis(3-tetradecylthiophen-2-yl)thieno[3,2-b]thiophenes) (pBTTT) was used for this study because of its high field effect mobilities [2]. Linear region mobility of 0. 12 cm2/Vs was obtained at VGS of -100 V. The experimental and simulated I-V characteristics are displayed in Figure 4. The electric fields (E) used in the transient experiments were 104 V/cm. The average drift velocity (v) of the carriers at these fields was greater than 4x 04 cm/s. These results would indicate the presence of carriers in the channel of a transistor that can respond to input frequencies (f) in the megahertz range. (f= v/271L) One of the major significance of these fast response times is the opportunity to construct circuits that can surpass the performance barrier posed by low FET mobility. The maximum operating frequency for digital circuits is governed by the capacitive delays in forming the channel. However, even with a partially formed channel, switching operations can be performed by the faster carriers capable of responding to the input frequency. Therefore a class of circuits can be constructed that doesn't require the completion of channel formation. An example of such a circuit is a rectifier. A rectifier is an integral component of an RFID tag, which converts the inductively coupled ac input power into dc voltages used to operate the rest of the circuit. Such circuits can be operated at frequencies much higher than that predicted by the steady state mobility. In summary, we have made the first measurements of drift velocity and mobility in a polymer transistor. The drift mobilities are 10 times higher than the field-effect mobilities. These high mobilities have been used to explain high frequency operation of organic transistor circuits. This method can be also used to explore trap states and achieve a more complete understanding of charge transport.
有机薄膜晶体管的高速特性
我们开发了一种表征有机薄膜晶体管中载流子漂移速度和迁移率的电子方法。测量是基于注入到信道中的载波包的运动。得到的漂移移动量大于1 cm2/Vs。这些结果可能导致在兆赫范围内工作的一类电路的发展。这种技术也可以用来探索陷阱状态,从而获得对这些材料中电荷输运的全面理解。这是在有机晶体管上进行的第一次此类实验。有机半导体具有易加工、材料多样等特点。然而,有机电路的应用受到低运行速度的阻碍。这是由于大多数载流子被困在局域状态,导致低场效应迁移率。然而,Dunn等人通过用阶跃电压[1]激励晶体管,证明了在五苯晶体管的通道中存在快速载流子。对于场效应迁移率为0.07 cm2/Vs的器件,得到了0.18 cm2/Vs的漂移迁移率。脉冲电压法是阶跃电压法的扩展,可用于测量不同偏置条件下的漂移速度。实验示意图如图1所示。为了用脉冲方法研究输运,晶体管被接通并置于导电状态。随后是一个小扰动的叠加,一个宽度(FWHM)为15 nsec的5 V脉冲,在晶体管的源端,否则在0 V(图2)。因此,一个电荷载流子包被注入通道。如图3所示的仿真结果表明,注入的载流子电流的漂移分量超过了位移分量。对于这些小时间尺度的操作,扩散分量也可以忽略不计。通过将漏极偏置限制在低电压,可以安全地假定通道内的电场是均匀的。因此,传递时间可以与漂移迁移率关系式为t = L2/_ VDS。一旦载流子磁通到达漏极,就使用偏置t将瞬态电流转移到500q电阻中。因此,电阻两端的电压是对脉冲产生的电流的测量。在不同漏极电压下,Vg = -90时电流脉冲的形状如图2所示。通过在实验装置中减去寄生RC延迟,可以提取电流脉冲的真实瞬变时间。这产生了1.5 (+0.45,-0.2)cm2/Vs的迁移率,比FET迁移率高-10倍。采用聚(2,5-二(3-十四烷基噻吩-2-基)噻吩[3,2-b]噻吩)(pBTTT),因其具有高场效应迁移率[2]。线性区域迁移率为0。在-100 V的电压下得到了12 cm2/Vs。实验和模拟的I-V特性如图4所示。瞬态实验使用的电场(E)为104 V/cm。在这些场中载流子的平均漂移速度(v)大于4 × 04 cm/s。这些结果将表明在晶体管的通道中存在载流子,可以响应兆赫范围内的输入频率(f)。(f= v/271L)这些快速响应时间的主要意义之一是有机会构建可以超越低场效应管迁移率带来的性能障碍的电路。数字电路的最大工作频率是由形成信道的电容延迟决定的。然而,即使使用部分形成的信道,开关操作也可以由能够响应输入频率的更快载波执行。因此,可以构造一类不需要完成通道形成的电路。这种电路的一个例子是整流器。整流器是RFID标签的一个组成部分,它将电感耦合的交流输入电源转换成直流电压,用于操作电路的其余部分。这种电路可以在比稳态迁移率预测的频率高得多的频率下工作。总之,我们首次测量了聚合物晶体管的漂移速度和迁移率。漂移迁移率比场效应迁移率高10倍。这些高迁移率被用来解释有机晶体管电路的高频工作。这种方法也可以用来探索陷阱状态和实现电荷输运的更完整的理解。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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