A novel technique for noise-tolerance in dynamic circuits

Abstract

Noise issues in deep submicron CMOS VLSI circuits have an importance comparable to area, delay and power consumption issues due to aggressive scaling trends in devices and interconnections. An attempt has been made to address this problem in this paper. A new technique to make dynamic CMOS circuits noise tolerant has been proposed by the authors. Simulation results for a dynamic-CMOS NAND gate and a dynamic-CMOS 1-bit full-adder circuit show that the proposed technique has an improvement in ANTE of 6.0X over conventional dynamic logic. The proposed technique, in comparison with the twin transistor technique, proves to improve ANTE by 2.8X. There is a large power dissipation incurred during the evaluation period for certain input combinations.