Electrothermal characterization of carbon nanotube field effect transistors (CNTFETs)

Abstract

Electrothermal characterization of single-walled carbon nanotube (SWCNT) field effect transistors (CNTFETs) is performed in this paper. By solving one-dimensional heat conduction equation in the channel self-consistently, self-heating effects on the I-V characteristics, signal delay and cutoff frequency of the CNTFET are studied. Simulated results indicate that the performance degradation of the CNTFET, due to self-heating effect, is quite low than that of silicon-based FET counterparts. Therefore, CNTFETs are good candidates for advanced active devices with low power dissipation and good reliability for high operating temperature.