Hajin Sung, Eakhwan Song, M. Kim, Yujeong Shim, Sunkyu Kong, J. Kwon, Joungho Kim
{"title":"Design of toroidal current probe embedded in multi-layer printed circuit boards for electrostatic discharge(ESD) detection","authors":"Hajin Sung, Eakhwan Song, M. Kim, Yujeong Shim, Sunkyu Kong, J. Kwon, Joungho Kim","doi":"10.1109/EDAPS.2010.5682996","DOIUrl":null,"url":null,"abstract":"In this paper, we propose a novel toroidal current probe embedded in multi-layer printed circuit boards (PCBs) for electrostatic discharge (ESD) detection. The proposed current probe consists of an inner via-array, bridge lines, and an outer via-array, which surround an ESD current path and form a toroid to detect an ESD current. A transfer impedance between a port injected an ESD current and the proposed current probe is used for analysis of an ESD current coupling. Through experimental measurements, we verified the proposed current probe by comparison with a conventional current probe.","PeriodicalId":185326,"journal":{"name":"2010 IEEE Electrical Design of Advanced Package & Systems Symposium","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE Electrical Design of Advanced Package & Systems Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDAPS.2010.5682996","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
In this paper, we propose a novel toroidal current probe embedded in multi-layer printed circuit boards (PCBs) for electrostatic discharge (ESD) detection. The proposed current probe consists of an inner via-array, bridge lines, and an outer via-array, which surround an ESD current path and form a toroid to detect an ESD current. A transfer impedance between a port injected an ESD current and the proposed current probe is used for analysis of an ESD current coupling. Through experimental measurements, we verified the proposed current probe by comparison with a conventional current probe.