Qualification of Electronic Systems for Radiation Environments of High Energy Accelerator

S. Uznanski, R. G. Alía, M. Brugger, C. Cangialosi, S. Danzeca, B. Todd
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引用次数: 1

Abstract

Unlike a typical Radiation Hardness Assurance (RHA) methodology, this work presents a system level radiation qualification of a complex electronic system prior to component radiation characterization tests. Such a top-down approach reduces the beam time needed for qualification of components by carefully analyzing failure modes observed on the system level and performing only a subset of component tests for identified cases. This avoids system overdesign, reduces the testing workload and cost by accepting a certain residual failure rate.
高能加速器辐射环境电子系统的鉴定
与典型的辐射硬度保证(RHA)方法不同,这项工作在组件辐射特性测试之前提出了复杂电子系统的系统级辐射鉴定。这种自顶向下的方法通过仔细分析在系统级别观察到的故障模式,并仅对已确定的情况执行组件测试的子集,减少了组件鉴定所需的光束时间。这避免了系统的过度设计,通过接受一定的剩余故障率减少了测试工作量和成本。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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