S. Uznanski, R. G. Alía, M. Brugger, C. Cangialosi, S. Danzeca, B. Todd
{"title":"Qualification of Electronic Systems for Radiation Environments of High Energy Accelerator","authors":"S. Uznanski, R. G. Alía, M. Brugger, C. Cangialosi, S. Danzeca, B. Todd","doi":"10.23919/MIXDES.2018.8436726","DOIUrl":null,"url":null,"abstract":"Unlike a typical Radiation Hardness Assurance (RHA) methodology, this work presents a system level radiation qualification of a complex electronic system prior to component radiation characterization tests. Such a top-down approach reduces the beam time needed for qualification of components by carefully analyzing failure modes observed on the system level and performing only a subset of component tests for identified cases. This avoids system overdesign, reduces the testing workload and cost by accepting a certain residual failure rate.","PeriodicalId":349007,"journal":{"name":"2018 25th International Conference \"Mixed Design of Integrated Circuits and System\" (MIXDES)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 25th International Conference \"Mixed Design of Integrated Circuits and System\" (MIXDES)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/MIXDES.2018.8436726","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Unlike a typical Radiation Hardness Assurance (RHA) methodology, this work presents a system level radiation qualification of a complex electronic system prior to component radiation characterization tests. Such a top-down approach reduces the beam time needed for qualification of components by carefully analyzing failure modes observed on the system level and performing only a subset of component tests for identified cases. This avoids system overdesign, reduces the testing workload and cost by accepting a certain residual failure rate.