Developments in fine pitch copper wire bonding production

B. Chylak
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引用次数: 24

Abstract

Copper wire bonding has huge cost advantages over gold wire bonding. Wire bonding and materials companies have invested heavily in R&D in the last 2 or 3 years and are starting to see the fruits of their labor. Low pin count, heavy wire packages have already been converted to copper wire and many companies are in high volume production. An extensive amount of development activity has targeted high pin count (>200 I/O) and high performance applications. Recently this work has paid off, as there has been an increase in this market segment that has drastically exceeded earlier predictions by market analysts. What the recent Research & Development has done is to actually fill in the knowledge gaps for copper wire bonding. This knowledge has fueled technology development, which, in turn, has enabled the current transition to high volume fine pitch production. In this paper I will discuss some of the technology developments that have overcome the challenges and make recommendations for implementing copper wire bonding as a replacement for gold in high volume manufacturing of high pin count packages. Specific areas of technology development that I will cover are advancements in stable free air ball formation, designs and techniques to eliminate or control pad damage, developments in molding compounds, and copper reliability fundamentals.
细间距铜线键合生产的发展
铜线粘接比金线粘接具有巨大的成本优势。在过去的两三年里,电线粘合和材料公司在研发方面投入了大量资金,并开始看到他们的劳动成果。低引脚数,重线封装已经转换为铜线,许多公司都在大批量生产。大量的开发活动针对高引脚数(>200 I/O)和高性能应用程序。最近,这项工作得到了回报,因为这一细分市场的增长大大超过了市场分析师早先的预测。最近的研究和发展所做的实际上是填补了铜线键合的知识空白。这些知识推动了技术的发展,这反过来又使当前的过渡到大批量细间距生产成为可能。在本文中,我将讨论一些已经克服挑战的技术发展,并提出在高引脚数封装的大批量制造中实现铜线键合作为金的替代品的建议。我将介绍的技术发展的具体领域是稳定的自由空气球形成,消除或控制垫损坏的设计和技术,成型化合物的发展以及铜可靠性基础的进步。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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