Characterization of semi-insulating InP: Cu

R. P. Leon, P. Werner, E. Weber
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引用次数: 1

Abstract

Systematic characterization of InP diffused with Cu have shown that both initially p-type and n-type InP become semi-insulating after Cu diffusion. It is also observed that thermally stable In-Cu rich precipitates form, that the concentration of deep levels is negligible and that InP:Cu samples exhibit inhomogeneities and anomalous transport behavior. These observations support the supposition that the observed semi-insulating behavior in InP:Cu can be best explained by the buried Schottky barrier model, instead of the commonly observed compensation by deep levels.
半绝缘InP: Cu的表征
系统表征了Cu扩散后的InP,结果表明,初始p型InP和n型InP在Cu扩散后都变成半绝缘的。还观察到形成热稳定的富In-Cu沉淀,深层浓度可以忽略不计,InP:Cu样品表现出不均匀性和异常输运行为。这些观察结果支持了InP:Cu中观察到的半绝缘行为可以最好地用埋藏肖特基势垒模型来解释,而不是通常观察到的深能级补偿。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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