Detection of Stuck-at and Bridging Fault in Reversible Circuits using an Augmented Circuit

Mousum Handique, J. K. Deka, S. Biswas
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Abstract

Low-power design is a major concern in the circuit design domain. The reversible circuit is an alternative for moving beyond the conventional ways of computing. For performing the high reliability and the correctness of the circuit, testing is necessary for evaluating the faults. This paper presents the fault detection method for classical fault models like stuck-at faults and bridging faults in reversible circuits using the negative-controlled augmented k-CNOT based circuit. We initially construct the n number of test vectors with n input lines for a given circuit. The constructed test vector sequences successfully attempt as the complete test set on the testable design augmented k-CNOT circuit for detecting faults. The proposed method applies to several benchmark circuits for detecting the stuck-at and bridging faults and also comparative analysis is prepared with some existing works.
用增强电路检测可逆电路中的卡滞和桥接故障
低功耗设计是电路设计领域的一个主要问题。可逆电路是一种超越传统计算方式的替代方案。为了实现电路的高可靠性和正确性,测试是评估故障的必要手段。提出了一种基于负控增广k-CNOT的可逆电路中卡滞故障和桥接故障等经典故障模型的故障检测方法。我们最初为给定电路构造n个带有n条输入线的测试向量。构建的测试向量序列成功地作为测试设计增强k-CNOT电路的完整测试集进行故障检测。将该方法应用于几种检测卡滞和桥接故障的基准电路,并与已有的一些工作进行了对比分析。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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