R. Molina-Robles, R. García-Ramírez, A. Chacón-Rodríguez, R. Rímolo-Donadío, A. Arnaud
{"title":"An affordable post-silicon testing framework applied to a RISC-V based microcontroller","authors":"R. Molina-Robles, R. García-Ramírez, A. Chacón-Rodríguez, R. Rímolo-Donadío, A. Arnaud","doi":"10.1109/LAEDC51812.2021.9437939","DOIUrl":null,"url":null,"abstract":"The RISC-V architecture is a very attractive option for developing application specific systems needing an affordable yet efficient central processing unit. Post-silicon validation on RISC-V applications has been done in industry for a while, however documentation is scarce. This paper proposes a practical low-cost post-silicon testing framework applied to a RISC-V RV32I based microcontroller. The framework uses FPGA-based emulation as a cornerstone to test the microcontroller before and after its fabrication. The platform only requires a handful of elements like the FPGA, a PC, the fabricated chip and some discrete components, without losing the capacity to functionally validate the design under test and save development testing time by using a re-utilize philosophy.","PeriodicalId":112590,"journal":{"name":"2021 IEEE Latin America Electron Devices Conference (LAEDC)","volume":"217 ","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-04-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE Latin America Electron Devices Conference (LAEDC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LAEDC51812.2021.9437939","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
The RISC-V architecture is a very attractive option for developing application specific systems needing an affordable yet efficient central processing unit. Post-silicon validation on RISC-V applications has been done in industry for a while, however documentation is scarce. This paper proposes a practical low-cost post-silicon testing framework applied to a RISC-V RV32I based microcontroller. The framework uses FPGA-based emulation as a cornerstone to test the microcontroller before and after its fabrication. The platform only requires a handful of elements like the FPGA, a PC, the fabricated chip and some discrete components, without losing the capacity to functionally validate the design under test and save development testing time by using a re-utilize philosophy.