Field Stability Investigation of Electrical Conductivity of a Dielectric Filled with a Conductive Compound

I. Agapov
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Abstract

The paper is devoted to the problem of space onboard equipment stability to the factors of internal charging. Spacecraft dielectrics should have increased conductivity to exclude physical possibility of electrostatic discharges in them when exposed to near-Earth plasma electron radiation. It is possible to achieve an increase in the conductivity of dielectrics by introducing a finely-divided conductive compound into them; its concentration should be carefully controlled in order to remain near the percolation threshold. However, during preliminary research, it has been found out that application of voltage to metal-dielectric-conductor structures (MDM), manufactured on the basis of such dielectrics, may lead to spontaneous instabilities of the electric current passing through the dielectric. A method for testing nano-conductive dielectrics of this type for long-term current flow has been developed. The purpose of this paper is to explain the mechanism of a significant decrease (up to 10 or more times) in the conductivity of dielectrics with increased conductivity during the flow of high currents and to develop a physical model on this basis that would allow to explain the observed phenomenon. Such a model will make it possible to predict the life time of dielectrics, working not only in near-Earth plasma, but also during interplanetary missions (for example, to Jupiter, where the flows of charged particles are three orders of magnitude higher than the near-Earth ones).
导电化合物填充介质电导率的场稳定性研究
研究了空间机载设备在内部充电因素影响下的稳定性问题。航天器电介质应增加导电性,以排除暴露于近地等离子体电子辐射时产生静电放电的物理可能性。通过在电介质中引入精细划分的导电化合物,可以实现电介质导电性的增加;应仔细控制其浓度,以保持在渗透阈值附近。然而,在初步研究中发现,在基于这种介质制造的金属-介电-导体结构(MDM)上施加电压可能会导致通过介质的电流自发不稳定。开发了一种测试这种类型的纳米导电介质的长期电流的方法。本文的目的是解释在大电流流动中电导率增加的电介质的电导率显著下降(高达10倍或更多)的机制,并在此基础上建立一个物理模型,以解释所观察到的现象。这样的模型将使预测电介质的寿命成为可能,不仅适用于近地等离子体,也适用于行星际任务(例如,前往木星,那里的带电粒子流比近地高三个数量级)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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