InAs Quantum Dots Grown on Selective Areas with a Metal Mask for Photonic-Crystal-Based Ultra-Small and Ultra-Fast All Optical Devices

N. Ozaki, Y. Takata, S. Ohkouchi, Y. Sugimoto, N. Ikeda, Y. Watanabe, Y. Kitagawa, A. Mizutani, K. Asakawa
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Abstract

A metal-mask (MM) method for selective-area-growth (SAG) of self-assembled InAs quantum dots (QDs) on a GaAs substrate was developed for applications of ultra-small and ultra-fast all optical devices based on a combination of QD and photonic crystal waveguides (PC-WGs). Successful SAG of QDs with high density and high optical quality comparable to conventional InAs-QDs grown without the MM was confirmed by atomic force microscopy and photoluminescence (PL) measurements. The QD density was 4times1010 cm-2 and FWHM of the PL emission was around 30 meV at room temperature. By insertion of a strain-reducing layer on the QD, the PL peak wavelength was controlled from 1240 nm to 1320 nm. The MM method is promising for realizing the PC-based all optical devices, which require SAG of QDs and a QD ensemble with a different absorption-peak wavelength in a different area.
利用金属掩膜在选择性区域生长的InAs量子点用于基于光子晶体的超小型超快全光器件
提出了一种在砷化镓衬底上实现自组装InAs量子点选择性面积生长(SAG)的金属掩膜(MM)方法,用于基于量子点和光子晶体波导(PC-WGs)组合的超小型超快全光器件。通过原子力显微镜和光致发光(PL)测量证实,在没有MM的情况下生长的量子点具有高密度和高光学质量。量子点密度为4倍1010 cm-2,室温下PL发射的FWHM约为30 meV。通过在量子点上插入应变减小层,将发光峰波长控制在1240 ~ 1320 nm之间。MM方法有望实现基于pc的全光器件,这需要量子点的SAG和在不同区域具有不同吸收峰波长的量子点系综。
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