A forward body-biased-low-leakage SRAM cache: device and architecture considerations

C.H. Kim, Jae-Joon Kim, S. Mukhopadhyay, K. Roy
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引用次数: 13

Abstract

This paper presents a forward body-biasing (FBB) scheme for active leakage power reduction in cache memories. We utilize super high V/sub T/ (threshold voltage) devices to suppress the leakage power in unselected portions of a cache while fast operation is achieved by dynamically forward body-biasing the selected SRAM cells. In order to generate a super high V/sub T/ device, the 2D halo doping profile was optimized by considering different nanometer regime leakage mechanisms. The transition latency and energy overhead associated with FBB could be minimized by (i) waking up the SRAM cells ahead of the access and (ii) exploiting the cache access pattern. The combined device-circuit-architecture level techniques offer 64% total leakage reduction and 7.3% improvement in bitline delay compared to a previous state-of-the-art low-leakage SRAM technique.
前向体偏低泄漏SRAM缓存:器件和架构考虑
提出了一种前向体偏置(FBB)方案,用于降低高速缓存存储器的有源泄漏功率。我们利用超高V/sub /(阈值电压)器件来抑制缓存中未选择部分的泄漏功率,同时通过动态前向体偏置所选SRAM单元实现快速操作。为了生成超高V/sub T/器件,考虑了不同的纳米区泄漏机制,对二维晕掺杂谱进行了优化。与FBB相关的转换延迟和能量开销可以通过(i)在访问之前唤醒SRAM单元和(ii)利用缓存访问模式来最小化。与之前最先进的低泄漏SRAM技术相比,结合器件电路架构级技术可减少64%的总泄漏,并将位线延迟提高7.3%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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