X-Gen: a random test-case generator for systems and SoCs

Abstract

We present X-Gen, a model-based test-case generator designed for systems and systems on a chip (SoC). X-Gen provides a framework and a set of building blocks for system-level test-case generation. At the core of this framework lies a system model, which consists of component types, their configuration, and the interactions between them. Building blocks include commonly used concepts such as memories, registers, and address translation mechanisms. Once a system is modeled, X-Gen provides a rich language for describing test cases. Through this language, users can specify requests that cover the full spectrum between highly directed tests to completely random ones. X-Gen is currently in preliminary use at IBM for the verification of two different designs - a high-end multi-processor server and a state-of-the-art SoC.