Artificial intelligence techniques for SPICE optimization of MOSFET modeling

Abstract

This paper proposes new method for optimize and verified electric characterization graph of MOSFET by using artificial neural network. Optimization using Neural Network (ONN) will compare current-voltage (I–V) Characteristic graph between the TCAD simulation and TSPICE modeling as desire data control a model parameter of BSIM. In this paper, the neural network method is dynamic feedforward Neural Network. After NN training, the best result is at Neural Network architecture of 36-30-10-5 with Mean Squared Error (MSE) of 1e-28 at epoch of 5.