{"title":"On the mitigation of single event transients on flash-based FPGAs","authors":"S. Azimi, B. Du, L. Sterpone","doi":"10.1109/ETS.2018.8400715","DOIUrl":null,"url":null,"abstract":"Thanks to the immunity against Single Event Upsets in configuration memory, Flash-based FPGA is becoming widely adopted in mission- and safety-critical applications, such as in aerospace field. However, the decreasing of device feature size leads to an increasing of the device sensitivity regarding Single Event Transients (SETs). In this paper, we developed a new workflow to evaluate SET phenomena in a specific convergence case and introduce a new mitigation of SET pulse without introducing any performance penalization to the original netlist.","PeriodicalId":223459,"journal":{"name":"2018 IEEE 23rd European Test Symposium (ETS)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 23rd European Test Symposium (ETS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETS.2018.8400715","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Thanks to the immunity against Single Event Upsets in configuration memory, Flash-based FPGA is becoming widely adopted in mission- and safety-critical applications, such as in aerospace field. However, the decreasing of device feature size leads to an increasing of the device sensitivity regarding Single Event Transients (SETs). In this paper, we developed a new workflow to evaluate SET phenomena in a specific convergence case and introduce a new mitigation of SET pulse without introducing any performance penalization to the original netlist.