{"title":"Future trends in nonvolatile memories","authors":"P. Suciu","doi":"10.1109/ISSCC.1987.1157075","DOIUrl":null,"url":null,"abstract":"Key areas to be assessed by the panelists are the merits of non-volatile memory techniques, tradeoffs between them and forecasts of trends in the next decade. Additionally, user and manufacturer panelists will probe the future of EPROMs, flash E2PROMs and E2PROMs.","PeriodicalId":102932,"journal":{"name":"1987 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1987 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1987.1157075","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Key areas to be assessed by the panelists are the merits of non-volatile memory techniques, tradeoffs between them and forecasts of trends in the next decade. Additionally, user and manufacturer panelists will probe the future of EPROMs, flash E2PROMs and E2PROMs.