{"title":"Analysis of the critical rise time in MOBILE-based circuits","authors":"J. Quintana, M. Avedillo","doi":"10.1109/ICECS.2008.4675009","DOIUrl":null,"url":null,"abstract":"It is well known that there is a critical value for the rising time of the clocked bias signal which limits the operating speed of MOBILE-based circuits. This paper analyzes the transient response of a MOBILE-based follower and obtains analytical expressions to calculate the critical value for the rising time of the bias signal below which the circuit does not operate correctly. This analysis has been extended to more complex circuits such as threshold gates, we have also derived operating speed limits for these circuits. Results obtained have been validated through extensive simulations with HSPICE.","PeriodicalId":404629,"journal":{"name":"2008 15th IEEE International Conference on Electronics, Circuits and Systems","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-11-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 15th IEEE International Conference on Electronics, Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICECS.2008.4675009","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
It is well known that there is a critical value for the rising time of the clocked bias signal which limits the operating speed of MOBILE-based circuits. This paper analyzes the transient response of a MOBILE-based follower and obtains analytical expressions to calculate the critical value for the rising time of the bias signal below which the circuit does not operate correctly. This analysis has been extended to more complex circuits such as threshold gates, we have also derived operating speed limits for these circuits. Results obtained have been validated through extensive simulations with HSPICE.