Process, voltage and temperature compensation of off-chip-driver circuits for sub-0.25-/spl mu/m CMOS technology

Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334) Pub Date : 1997-09-07 DOI:10.1109/ASIC.1997.617021

H. Chi, D. Stout, J. Chickanosky

引用次数: 3

Abstract

A control circuit that compensates for variations in process, voltage and temperature (PVT) has been developed to control off-chip-driver circuits used for sub-0.25-/spl mu/m technology. The off-chip-driver (OCD), alone with a simple control scheme, delivers a tight impedance tolerance at the output, improving the output signal waveforms. Across-chip length variation (ACLV), the controlled-circuit design and off-chip-driver performance are also discussed.

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低于0.25-/spl μ m CMOS技术的片外驱动电路的工艺、电压和温度补偿

一种补偿过程、电压和温度(PVT)变化的控制电路已经开发出来，用于控制芯片外驱动电路，用于低于0.25-/spl mu/m的技术。片外驱动器(OCD)单独使用简单的控制方案，在输出端提供紧密的阻抗容限，改善输出信号波形。讨论了跨片长度变化(ACLV)、控制电路设计和片外驱动性能。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334)

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